EPMA > JEOL 8900R Electron Probe Microanalyzer |
The JEOL-8900 Electron Probe Microanalyzer (EPMA) is optimized for quantitative, non-destructive chemical analysis of solid materials on a micron scale. Four fully automated wavelength dispersive spectrometers (WDS) are equipped with 2 crystals and are capable of quantifying elements ranging from boron to uranium (Standards). Concentrations of at least 0.10 wt % can be measured to within ±1% of the measured abundance. Elements present in smaller concentrations can also be measured with somewhat less precision. The energy dispersive spectrometer (EDS)
collects a full spectrum of x-rays at once and is capable of rapidly examining
up to 8 elements at one time.
The EMP is also equipped with backscattered electron, secondary electron, and cathodoluminescence (CL) detectors capable of producing "real time" images, or automated images in tandem with x-ray mapping to further characterize the area of interest. A fully automated stage, capable of holding up to nine one-inch round samples (or six petrographic sections) has reproducibility of less than one micron. Unmounted samples up to 15 cm in diameter and 5 cm high can also be accommodated. In order to obtain good quantitative results the samples should be flat and well polished. |
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