The JEOL-5600 Scanning Electron Microscope (SEM) is optimized for imaging micron to millimeter scale topography.
Resolution of up to 50 nm at 100,000 times magnification is possible.
The SEM is equipped with a backscattered electron (BSE) detector and an Oxford ISIS EDS system, capable of qualitative analysis.
Topographic and compositional images can be processed on the screen to show pseudo-color and critical point measurements of features. The images can also be combined, allowing for easy comparison of samples or different magnifications.
The manual stage can accommodate four 1 cm diameter samples or one sample up to 3.2 cm diameter.